BS ISO 17867:2020
Particle size analysis. Small angle X-ray scattering (SAXS)
Standard number: | BS ISO 17867:2020 |
Pages: | 36 |
Released: | 2020-10-09 |
ISBN: | 978 0 539 00600 1 |
Status: | Standard |
BS ISO 17867:2020 Particle Size Analysis - Small Angle X-ray Scattering (SAXS)
Unlock the potential of precise particle size analysis with the BS ISO 17867:2020 standard, a comprehensive guide dedicated to the Small Angle X-ray Scattering (SAXS) technique. This standard is an essential resource for professionals in the field of material science, nanotechnology, and any industry where understanding the microstructure of materials is crucial.
Overview
The BS ISO 17867:2020 standard provides a detailed framework for conducting particle size analysis using the SAXS method. Released on October 9, 2020, this standard is a testament to the latest advancements in the field, ensuring that you are equipped with the most current methodologies and practices.
Key Features
- Standard Number: BS ISO 17867:2020
- Pages: 36
- ISBN: 978 0 539 00600 1
- Status: Standard
Why Choose SAXS for Particle Size Analysis?
Small Angle X-ray Scattering (SAXS) is a powerful technique for analyzing the size, shape, and distribution of particles at the nanoscale. It is particularly useful for:
- Non-destructive analysis of materials.
- Providing information on particle size distribution and shape.
- Analyzing complex fluids, polymers, and biological macromolecules.
- Offering insights into the internal structure of materials.
Comprehensive Guidance
The BS ISO 17867:2020 standard spans 36 pages of in-depth information, offering a thorough understanding of the SAXS technique. It covers everything from the basic principles to advanced applications, ensuring that users can effectively implement SAXS in their research and development processes.
Applications Across Industries
This standard is invaluable across a range of industries, including:
- Pharmaceuticals: For analyzing drug delivery systems and formulations.
- Materials Science: To study the microstructure of metals, ceramics, and composites.
- Nanotechnology: For characterizing nanoparticles and nanostructures.
- Biotechnology: In the analysis of proteins, lipids, and other biological macromolecules.
Stay Ahead with the Latest Standard
In a rapidly evolving field, staying updated with the latest standards is crucial. The BS ISO 17867:2020 ensures that you are at the forefront of particle size analysis technology, providing you with the tools to achieve accurate and reliable results.
Conclusion
Whether you are a researcher, a quality control specialist, or a product developer, the BS ISO 17867:2020 standard is an indispensable resource. It not only enhances your understanding of SAXS but also empowers you to apply this knowledge effectively in your work. Embrace the precision and reliability of SAXS with this comprehensive standard and elevate your particle size analysis to new heights.
BS ISO 17867:2020
This standard BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS) is classified in these ICS categories:
- 19.120 Particle size analysis. Sieving
This document specifies a method for the application of small-angle X-ray scattering (SAXS) to the estimation of mean particle sizes in the 1 nm to 100 nm size range. It is applicable in dilute dispersions where the interaction and scattering effects between the particles are negligible. This document describes several data evaluation methods: the Guinier approximation, model-based data fitting, Monte-Carlo–based data fitting, the indirect Fourier transform method and the expectation maximization method. The most appropriate evaluation method is intended to be selected by the analyst and stated clearly in the report. While the Guinier approximation only provides an estimate for the mean particle diameter, the other methods also give insight in the particle size distribution.