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immediate downloadReleased: 2017-09-18
BS ISO 19668:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
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| Standard number: | BS ISO 19668:2017 |
| Pages: | 32 |
| Released: | 2017-09-18 |
| ISBN: | 978 0 580 92393 7 |
| Status: | Standard |
DESCRIPTION
BS ISO 19668:2017
This standard BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials is classified in these ICS categories:
- 71.040.40 Chemical analysis
This document specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.