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Homepage>BS Standards>37 IMAGE TECHNOLOGY>37.020 Optical equipment>BS ISO 20263:2024 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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immediate downloadReleased: 2024-11-21

BS ISO 20263:2024 - TC

Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

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Standard number:BS ISO 20263:2024 - TC
Pages:145
Released:2024-11-21
ISBN:978 0 539 34372 4
Status:Tracked Changes
DESCRIPTION

BS ISO 20263:2024 - TC


This standard BS ISO 20263:2024 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials is classified in these ICS categories:
  • 37.020 Optical equipment
  • 71.040.50 Physicochemical methods of analysis

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