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Homepage>BS Standards>71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.40 Chemical analysis>BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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immediate downloadReleased: 2020-02-07
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

BS ISO 21222:2020

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

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Standard number:BS ISO 21222:2020
Pages:26
Released:2020-02-07
ISBN:978 0 580 96429 9
Status:Standard

BS ISO 21222:2020 - Surface Chemical Analysis with Scanning Probe Microscopy

Unlock the potential of advanced material analysis with the BS ISO 21222:2020 standard, a comprehensive guide dedicated to the precise determination of elastic moduli for compliant materials. This standard is an essential resource for professionals in the field of surface chemical analysis, providing a detailed procedure using scanning probe microscopy, specifically the atomic force microscope (AFM), and the innovative two-point JKR method.

Overview of BS ISO 21222:2020

Released on February 7, 2020, this standard is a pivotal document in the realm of material science and engineering. It is meticulously crafted to aid researchers and engineers in accurately measuring the elastic properties of compliant materials, which are materials that can undergo significant deformation under stress. The standard is published under the ISBN 978 0 580 96429 9 and spans 26 pages of in-depth content.

Key Features

  • Standard Number: BS ISO 21222:2020
  • Pages: 26
  • Release Date: 2020-02-07
  • ISBN: 978 0 580 96429 9
  • Status: Standard

Why Choose BS ISO 21222:2020?

The BS ISO 21222:2020 standard is indispensable for those involved in the field of surface chemical analysis and material science. It provides a robust framework for utilizing scanning probe microscopy techniques to determine the elastic moduli of compliant materials. This is particularly crucial for industries where material flexibility and resilience are of paramount importance, such as in the development of polymers, biomaterials, and other advanced composites.

Advanced Methodology

The standard introduces the two-point JKR method, a sophisticated approach that enhances the accuracy of measurements obtained through atomic force microscopy. This method is designed to overcome the limitations of traditional techniques, offering a more reliable and precise analysis of material properties. By employing this method, users can achieve a deeper understanding of material behavior under various conditions, leading to more informed decisions in material selection and application.

Comprehensive Guidance

With 26 pages of detailed instructions and guidelines, BS ISO 21222:2020 provides comprehensive coverage of the procedures and considerations necessary for effective material analysis. It includes step-by-step instructions, ensuring that users can implement the techniques with confidence and precision. The standard also addresses potential challenges and offers solutions to common issues encountered during the analysis process.

Applications and Benefits

The applications of BS ISO 21222:2020 are vast and varied, making it a valuable asset across multiple sectors. Whether you are involved in research, product development, or quality assurance, this standard offers significant benefits:

  • Enhanced Material Understanding: Gain insights into the mechanical properties of materials, enabling better design and application.
  • Improved Product Performance: Ensure that materials meet the required standards for flexibility and durability, leading to superior product performance.
  • Innovative Research: Facilitate cutting-edge research in material science, contributing to advancements in technology and industry.
  • Quality Assurance: Implement rigorous testing protocols to maintain high standards of quality and reliability in material production.

Who Should Use This Standard?

BS ISO 21222:2020 is designed for a wide range of professionals, including:

  • Material Scientists: Researchers and developers focused on the properties and applications of new materials.
  • Engineers: Professionals involved in the design and testing of materials for various applications.
  • Quality Control Specialists: Experts responsible for ensuring the integrity and performance of materials in production.
  • Academic Researchers: Scholars conducting studies in the field of material science and engineering.

Conclusion

The BS ISO 21222:2020 standard is a vital tool for anyone involved in the analysis and application of compliant materials. By providing a detailed methodology for determining elastic moduli using advanced microscopy techniques, it empowers professionals to achieve greater accuracy and reliability in their work. Whether you are developing new materials or ensuring the quality of existing ones, this standard is an invaluable resource that will enhance your capabilities and contribute to your success in the field.

Embrace the future of material analysis with BS ISO 21222:2020 and take your research and development efforts to new heights.

DESCRIPTION

BS ISO 21222:2020


This standard BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method is classified in these ICS categories:
  • 71.040.40 Chemical analysis

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.