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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS QC 750100:1986+A2:1996 Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
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BS QC 750100:1986+A2:1996 Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

BS QC 750100:1986+A2:1996

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

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Standard number:BS QC 750100:1986+A2:1996
Pages:22
Released:2010-01-31
ISBN:978 0 580 69209 3
Status:Standard
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BS QC 750100:1986+A2:1996


This standard BS QC 750100:1986+A2:1996 Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This sectional specification applies to discrete semiconductor devices, excluding opto-electronic devices.


Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.