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31.080.01 Semiconductor devices in general
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BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Released: 2011-07-31
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264.00 EUR
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26.40 EUR
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Reading the standardfor 24 hours
79.20 EUR
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In stock
264.00 EUR
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2004-06-24
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Released: 1990-03-30
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396.00 EUR
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39.60 EUR
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118.80 EUR
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396.00 EUR
BS EN 60191-6:2009
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Released: 2010-04-30
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309.60 EUR
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30.96 EUR
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92.88 EUR
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309.60 EUR
BS EN 62779-1:2016
Semiconductor devices. Semiconductor interface for human body communication General requirements
Semiconductor devices. Semiconductor interface for human body communication General requirements
Released: 2016-06-30
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Released: 2011-08-31
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
Semiconductor devices. Discrete devices Semiconductor accelerometers
Released: 2011-02-28
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396.00 EUR
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39.60 EUR
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118.80 EUR
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396.00 EUR
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Sealing
Released: 2003-07-03
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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160.80 EUR
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16.08 EUR
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Reading the standardfor 24 hours
48.24 EUR
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160.80 EUR