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31.080.01 Semiconductor devices in general
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BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Sealing
Released: 2003-07-03
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Released: 2011-07-31
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264.00 EUR
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26.40 EUR
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Reading the standardfor 24 hours
79.20 EUR
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In stock
264.00 EUR
English Secure PDF
Immediate download
160.80 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
16.08 EUR
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48.24 EUR
English Hardcopy
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160.80 EUR
BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2009-10-31
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309.60 EUR
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30.96 EUR
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92.88 EUR
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309.60 EUR
BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Released: 2006-06-30
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367.20 EUR
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Reading the standardfor 1 hour
36.72 EUR
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Reading the standardfor 24 hours
110.16 EUR
English Hardcopy
In stock
367.20 EUR
English Secure PDF
Immediate download
264.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.40 EUR
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Reading the standardfor 24 hours
79.20 EUR
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264.00 EUR
BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Released: 1990-03-30
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396.00 EUR
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39.60 EUR
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118.80 EUR
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396.00 EUR
BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2004-06-24
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS EN 62298-3:2005
Teleweb application Superteletext profile
Teleweb application Superteletext profile
Released: 2005-10-14
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Immediate download
396.00 EUR
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39.60 EUR
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118.80 EUR
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396.00 EUR
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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309.60 EUR
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30.96 EUR
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92.88 EUR
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309.60 EUR
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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160.80 EUR
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16.08 EUR
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Reading the standardfor 24 hours
48.24 EUR
English Hardcopy
In stock
160.80 EUR