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31.080.01 Semiconductor devices in general
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BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Released: 2004-06-22
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160.80 EUR
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16.08 EUR
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Reading the standardfor 24 hours
48.24 EUR
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In stock
160.80 EUR
BS EN IEC 60747-5-5:2020
Semiconductor devices Optoelectronic devices. Photocouplers
Semiconductor devices Optoelectronic devices. Photocouplers
Released: 2020-09-17
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367.20 EUR
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36.72 EUR
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Reading the standardfor 24 hours
110.16 EUR
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367.20 EUR
BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Released: 2023-03-27
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189.60 EUR
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Reading the standardfor 1 hour
18.96 EUR
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Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
English Secure PDF
Immediate download
264.00 EUR
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Reading the standardfor 1 hour
26.40 EUR
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Reading the standardfor 24 hours
79.20 EUR
English Hardcopy
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264.00 EUR
BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure
Environmental testing Tests. Test M: Low air pressure
Released: 2021-04-26
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS IEC 62880-1:2017
Semiconductor devices. Stress migration test standard Copper stress migration test standard
Semiconductor devices. Stress migration test standard Copper stress migration test standard
Released: 2020-07-21
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN IEC 60749-26:2018 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2020-02-27
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516.00 EUR
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516.00 EUR
BS IEC 60747-18-2:2020
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
Released: 2020-02-21
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
24/30491834 DC
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Released: 2024-04-23
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24.00 EUR
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24.00 EUR
BS EN 62298-3:2005
Teleweb application Superteletext profile
Teleweb application Superteletext profile
Released: 2005-10-14
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396.00 EUR
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39.60 EUR
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Reading the standardfor 24 hours
118.80 EUR
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396.00 EUR
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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309.60 EUR
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30.96 EUR
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Reading the standardfor 24 hours
92.88 EUR
English Hardcopy
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309.60 EUR