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31.080.01 Semiconductor devices in general
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BS EN 62418:2010
Semiconductor devices. Metallization stress void test
Semiconductor devices. Metallization stress void test
Released: 2010-08-31
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180.00 EUR
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18.00 EUR
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54.00 EUR
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180.00 EUR
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Released: 2011-09-30
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249.60 EUR
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24.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.88 EUR
English Hardcopy
In stock
249.60 EUR
English Secure PDF
Immediate download
180.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.00 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
54.00 EUR
English Hardcopy
In stock
180.00 EUR
English Secure PDF
Immediate download
249.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.88 EUR
English Hardcopy
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249.60 EUR
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
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331.20 EUR
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33.12 EUR
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Reading the standardfor 24 hours
99.36 EUR
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In stock
331.20 EUR
English Secure PDF
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24.00 EUR
English Hardcopy
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24.00 EUR
PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Released: 2001-03-15
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151.20 EUR
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15.12 EUR
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45.36 EUR
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151.20 EUR
PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
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Immediate download
151.20 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
15.12 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
45.36 EUR
English Hardcopy
In stock
151.20 EUR
English Secure PDF
Immediate download
180.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.00 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
54.00 EUR
English Hardcopy
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180.00 EUR
BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Released: 2020-10-14
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249.60 EUR
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24.96 EUR
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74.88 EUR
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249.60 EUR
BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Released: 2020-09-09
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249.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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24.96 EUR
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Reading the standardfor 24 hours
74.88 EUR
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249.60 EUR
English Secure PDF
Immediate download
252.00 EUR
English Hardcopy
In stock
252.00 EUR