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31.080.01 Semiconductor devices in general
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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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160.80 EUR
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16.08 EUR
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Reading the standardfor 24 hours
48.24 EUR
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160.80 EUR
BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
Semiconductor devices. Discrete devices Semiconductor accelerometers
Released: 2011-02-28
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396.00 EUR
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39.60 EUR
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118.80 EUR
English Hardcopy
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396.00 EUR
BS EN 62779-1:2016
Semiconductor devices. Semiconductor interface for human body communication General requirements
Semiconductor devices. Semiconductor interface for human body communication General requirements
Released: 2016-06-30
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Released: 2011-08-31
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Released: 2021-02-03
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Released: 2022-07-19
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Released: 2021-10-11
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
English Secure PDF
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN IEC 60749-18:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2020-02-24
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369.60 EUR
English Secure PDF
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326.40 EUR
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369.60 EUR
English Hardcopy
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326.40 EUR
BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2020-02-24
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225.60 EUR
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225.60 EUR
22/30443234 DC
BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis
BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis
Released: 2022-01-24
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24.00 EUR
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24.00 EUR
BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Released: 2023-02-02
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189.60 EUR
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18.96 EUR
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Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
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189.60 EUR