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31.080.01 Semiconductor devices in general
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BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Released: 2022-07-19
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
22/30443234 DC
BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis
BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis
Released: 2022-01-24
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24.20 EUR
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24.20 EUR
BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Released: 2021-02-03
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Released: 2021-10-11
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
English Secure PDF
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Released: 2019-11-22
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312.18 EUR
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31.22 EUR
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93.65 EUR
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312.18 EUR
BS EN IEC 60749-18:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2020-02-24
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372.68 EUR
English Secure PDF
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329.12 EUR
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372.68 EUR
English Hardcopy
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329.12 EUR
BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2020-02-24
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227.48 EUR
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227.48 EUR
BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Released: 2023-02-02
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191.18 EUR
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19.12 EUR
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57.35 EUR
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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191.18 EUR
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57.35 EUR
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BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-06
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR