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31.080.01 Semiconductor devices in general
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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
Released: 2010-06-30
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS IEC 60747-14-1:2010
Semiconductor devices Semiconductor sensors. Generic specification for sensors
Semiconductor devices Semiconductor sensors. Generic specification for sensors
Released: 2010-04-30
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
Released: 2003-10-30
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189.60 EUR
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18.96 EUR
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56.88 EUR
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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Released: 2018-04-30
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18.96 EUR
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56.88 EUR
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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Released: 2008-06-30
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Released: 2017-11-24
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS IEC 60747-14-5:2010
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Released: 2010-04-30
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Released: 2011-09-30
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189.60 EUR
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18.96 EUR
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56.88 EUR
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BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2019-06-10
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264.00 EUR
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79.20 EUR
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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Released: 2019-09-02
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS IEC 60747-19-1:2019
Semiconductor devices Smart sensors. Control scheme of smart sensors
Semiconductor devices Smart sensors. Control scheme of smart sensors
Released: 2019-11-29
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264.00 EUR
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79.20 EUR
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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Released: 2020-01-14
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR