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31.080.01 Semiconductor devices in general
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BS IEC 796-1:1990
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Released: 1991-02-28
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350.90 EUR
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35.09 EUR
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105.27 EUR
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350.90 EUR
BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Released: 2004-06-22
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
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24.20 EUR
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24.20 EUR
BS EN 60749-32:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-03-31
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN 60749-22:2003
Semiconductor devices. Mechanical and climatic test methods Bond strength
Semiconductor devices. Mechanical and climatic test methods Bond strength
Released: 2003-07-04
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Released: 2010-10-31
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Released: 2014-10-31
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods External visual examination
Released: 2017-11-24
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN IEC 60747-5-5:2020
Semiconductor devices Optoelectronic devices. Photocouplers
Semiconductor devices Optoelectronic devices. Photocouplers
Released: 2020-09-17
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370.26 EUR
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37.03 EUR
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111.08 EUR
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370.26 EUR
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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191.18 EUR
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19.12 EUR
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Reading the standardfor 24 hours
57.35 EUR
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191.18 EUR