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31.080.01 Semiconductor devices in general
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BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-08-16
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189.60 EUR
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18.96 EUR
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Reading the standardfor 24 hours
56.88 EUR
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189.60 EUR
BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
Released: 2021-11-30
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348.00 EUR
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34.80 EUR
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Reading the standardfor 24 hours
104.40 EUR
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348.00 EUR
22/30443678 DC
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
Released: 2022-03-30
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24.00 EUR
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24.00 EUR
BS EN IEC 60749-37:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Released: 2022-12-20
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369.60 EUR
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369.60 EUR
23/30477062 DC
BS EN IEC 62007-2. Semiconductor optoelectronic devices for fibre optic system applications Part 2. Measuring methods
BS EN IEC 62007-2. Semiconductor optoelectronic devices for fibre optic system applications Part 2. Measuring methods
Released: 2023-07-20
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24.00 EUR
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24.00 EUR
BS IEC 63378-2-1:2024
Thermal standardization on semiconductor packages 3D thermal simulation models of semiconductor packages for steady-state analysis. Discrete packages
Thermal standardization on semiconductor packages 3D thermal simulation models of semiconductor packages for steady-state analysis. Discrete packages
Released: 2024-10-29
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189.60 EUR
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18.96 EUR
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Reading the standardfor 24 hours
56.88 EUR
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189.60 EUR
24/30497546 DC
BS EN IEC 60749-24 Semiconductor devices. Mechanical and climatic test methods Part 24. Accelerated moisture resistance. Unbiased HAST
BS EN IEC 60749-24 Semiconductor devices. Mechanical and climatic test methods Part 24. Accelerated moisture resistance. Unbiased HAST
Released: 2024-09-06
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24.00 EUR
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24.00 EUR
24/30497538 DC
BS EN IEC 60749-7 Semiconductor devices. Mechanical and climatic test methods Part 7. Internal moisture content measurement and the analysis of other residual gases
BS EN IEC 60749-7 Semiconductor devices. Mechanical and climatic test methods Part 7. Internal moisture content measurement and the analysis of other residual gases
Released: 2024-09-06
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24.00 EUR
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24.00 EUR
24/30497542 DC
BS EN IEC 60749-21 Semiconductor devices. Mechanical and climatic test methods Part 21. Solderability
BS EN IEC 60749-21 Semiconductor devices. Mechanical and climatic test methods Part 21. Solderability
Released: 2024-09-06
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24.00 EUR
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24.00 EUR
24/30502907 DC
BS EN IEC 60749-22-2 Semiconductor devices - Mechanical and climatic test methods Part 22-2: Bond strength - Wire bond shear test methods
BS EN IEC 60749-22-2 Semiconductor devices - Mechanical and climatic test methods Part 22-2: Bond strength - Wire bond shear test methods
Released: 2024-12-13
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24.00 EUR
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24.00 EUR
PD ES 59008-6-2:2001
Data requirements for semiconductor die. Exchange data formats and data dictionary Data dictionary
Data requirements for semiconductor die. Exchange data formats and data dictionary Data dictionary
Released: 2001-06-15
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN 60749-31:2003
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Released: 2003-07-04
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160.80 EUR
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16.08 EUR
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Reading the standardfor 24 hours
48.24 EUR
English Hardcopy
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160.80 EUR