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31.080.01 Semiconductor devices in general
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BS EN 60749-27:2006+A1:2012
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Released: 2013-01-31
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191.18 EUR
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19.12 EUR
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57.35 EUR
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In stock
191.18 EUR
BS EN 60749-21:2011
Semiconductor devices. Mechanical and climatic test methods Solderability
Semiconductor devices. Mechanical and climatic test methods Solderability
Released: 2011-08-31
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Released: 2006-11-30
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Released: 2001-05-15
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191.18 EUR
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19.12 EUR
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Reading the standardfor 24 hours
57.35 EUR
English Hardcopy
In stock
191.18 EUR
English Secure PDF
Immediate download
266.20 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.62 EUR
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79.86 EUR
English Hardcopy
In stock
266.20 EUR
BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Released: 2019-03-05
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS EN 60749-34:2010
Semiconductor devices. Mechanical and climatic test methods Power cycling
Semiconductor devices. Mechanical and climatic test methods Power cycling
Released: 2011-02-28
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 2016-11-30
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Released: 2017-11-27
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Released: 2019-11-22
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399.30 EUR
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39.93 EUR
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119.79 EUR
English Hardcopy
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399.30 EUR
BS IEC 62779-4:2020
Semiconductor devices. Semiconductor interface for human body communication Capsule endoscope
Semiconductor devices. Semiconductor interface for human body communication Capsule endoscope
Released: 2020-07-17
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Released: 2020-10-01
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191.18 EUR
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19.12 EUR
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Reading the standardfor 24 hours
57.35 EUR
English Hardcopy
In stock
191.18 EUR