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31.080.01 Semiconductor devices in general
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BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Released: 2021-02-03
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180.00 EUR
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18.00 EUR
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54.00 EUR
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180.00 EUR
BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Released: 2021-10-11
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180.00 EUR
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18.00 EUR
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54.00 EUR
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180.00 EUR
English Secure PDF
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151.20 EUR
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15.12 EUR
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45.36 EUR
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151.20 EUR
BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2009-10-31
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292.80 EUR
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29.28 EUR
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87.84 EUR
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292.80 EUR
BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Released: 2006-06-30
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348.00 EUR
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34.80 EUR
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104.40 EUR
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348.00 EUR
BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Released: 2011-07-31
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249.60 EUR
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24.96 EUR
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74.88 EUR
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249.60 EUR
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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292.80 EUR
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29.28 EUR
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87.84 EUR
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292.80 EUR
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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151.20 EUR
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15.12 EUR
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45.36 EUR
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151.20 EUR
BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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151.20 EUR
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15.12 EUR
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45.36 EUR
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151.20 EUR
BS EN 62298-3:2005
Teleweb application Superteletext profile
Teleweb application Superteletext profile
Released: 2005-10-14
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376.80 EUR
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37.68 EUR
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113.04 EUR
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376.80 EUR
BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Released: 2011-08-31
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249.60 EUR
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24.96 EUR
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74.88 EUR
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249.60 EUR
BS EN 62779-1:2016
Semiconductor devices. Semiconductor interface for human body communication General requirements
Semiconductor devices. Semiconductor interface for human body communication General requirements
Released: 2016-06-30
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180.00 EUR
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18.00 EUR
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Reading the standardfor 24 hours
54.00 EUR
English Hardcopy
In stock
180.00 EUR