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31.080.01 Semiconductor devices in general
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BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2004-06-24
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149.94 EUR
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Reading the standardfor 1 hour
14.99 EUR
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Reading the standardfor 24 hours
44.98 EUR
English Hardcopy
In stock
149.94 EUR
BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
Released: 2003-10-30
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178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
17.85 EUR
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53.55 EUR
English Hardcopy
In stock
178.50 EUR
BS EN 60749-27:2006+A1:2012
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Released: 2013-01-31
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Immediate download
178.50 EUR
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17.85 EUR
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53.55 EUR
English Hardcopy
In stock
178.50 EUR
BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Released: 2011-08-31
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247.52 EUR
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24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
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74.26 EUR
English Hardcopy
In stock
247.52 EUR
BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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149.94 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
14.99 EUR
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44.98 EUR
English Hardcopy
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149.94 EUR
BS EN 60749-31:2003
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Released: 2003-07-04
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Immediate download
149.94 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
14.99 EUR
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44.98 EUR
English Hardcopy
In stock
149.94 EUR
BS EN 60749-32:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-03-31
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Immediate download
149.94 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
14.99 EUR
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Reading the standardfor 24 hours
44.98 EUR
English Hardcopy
In stock
149.94 EUR
BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Released: 2004-06-22
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Immediate download
149.94 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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14.99 EUR
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44.98 EUR
English Hardcopy
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149.94 EUR
BS EN 60749-34:2010
Semiconductor devices. Mechanical and climatic test methods Power cycling
Semiconductor devices. Mechanical and climatic test methods Power cycling
Released: 2011-02-28
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Immediate download
149.94 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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14.99 EUR
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44.98 EUR
English Hardcopy
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149.94 EUR
BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Released: 2006-11-30
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247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
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74.26 EUR
English Hardcopy
In stock
247.52 EUR
BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Released: 2003-06-19
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Immediate download
149.94 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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14.99 EUR
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Reading the standardfor 24 hours
44.98 EUR
English Hardcopy
In stock
149.94 EUR
BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Released: 2008-06-30
English Secure PDF
Immediate download
178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
17.85 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR