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31.080.01 Semiconductor devices in general
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BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Released: 2001-05-15
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 2016-11-30
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264.00 EUR
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26.40 EUR
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79.20 EUR
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In stock
264.00 EUR
BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Released: 2020-10-01
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 2020-09-30
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS IEC 60191-2:1966+A21:2020
Mechanical standardization of semiconductor devices Dimensions
Mechanical standardization of semiconductor devices Dimensions
Released: 2020-04-02
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396.00 EUR
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39.60 EUR
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Reading the standardfor 24 hours
118.80 EUR
English Hardcopy
In stock
396.00 EUR
BS IEC 62779-4:2020
Semiconductor devices. Semiconductor interface for human body communication Capsule endoscope
Semiconductor devices. Semiconductor interface for human body communication Capsule endoscope
Released: 2020-07-17
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Released: 2022-11-22
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN IEC 62007-1:2015+A1:2022
Semiconductor optoelectronic devices for fibre optic system applications Specification template for essential ratings and characteristics
Semiconductor optoelectronic devices for fibre optic system applications Specification template for essential ratings and characteristics
Released: 2022-11-24
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309.60 EUR
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30.96 EUR
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Reading the standardfor 24 hours
92.88 EUR
English Hardcopy
In stock
309.60 EUR
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
English Secure PDF
Immediate download
516.00 EUR
English Hardcopy
In stock
516.00 EUR
English Secure PDF
Immediate download
24.00 EUR
English Hardcopy
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24.00 EUR
BS EN IEC 60749-5:2024 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-09
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266.40 EUR
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266.40 EUR