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31.080.01 Semiconductor devices in general
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BS EN 62418:2010
Semiconductor devices. Metallization stress void test
Semiconductor devices. Metallization stress void test
Released: 2010-08-31
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191.18 EUR
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19.12 EUR
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Reading the standardfor 24 hours
57.35 EUR
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In stock
191.18 EUR
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191.18 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.12 EUR
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Reading the standardfor 24 hours
57.35 EUR
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191.18 EUR
BS EN 62415:2010
Semiconductor devices. Constant current electromigration test
Semiconductor devices. Constant current electromigration test
Released: 2010-07-31
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162.14 EUR
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16.21 EUR
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Reading the standardfor 24 hours
48.64 EUR
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In stock
162.14 EUR
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266.20 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.62 EUR
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Reading the standardfor 24 hours
79.86 EUR
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266.20 EUR
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
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350.90 EUR
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35.09 EUR
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Reading the standardfor 24 hours
105.27 EUR
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350.90 EUR
PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
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Immediate download
162.14 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
16.21 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
48.64 EUR
English Hardcopy
In stock
162.14 EUR
English Secure PDF
Immediate download
191.18 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.12 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
57.35 EUR
English Hardcopy
In stock
191.18 EUR
English Secure PDF
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24.20 EUR
English Hardcopy
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24.20 EUR
PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Released: 2001-03-15
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162.14 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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16.21 EUR
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Reading the standardfor 24 hours
48.64 EUR
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162.14 EUR
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
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399.30 EUR
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39.93 EUR
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Reading the standardfor 24 hours
119.79 EUR
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399.30 EUR
BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Released: 2003-12-15
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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266.20 EUR
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26.62 EUR
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Reading the standardfor 24 hours
79.86 EUR
English Hardcopy
In stock
266.20 EUR