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31.080.01 Semiconductor devices in general
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BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Released: 2003-10-24
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Released: 2018-04-30
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312.18 EUR
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31.22 EUR
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93.65 EUR
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312.18 EUR
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
Semiconductor devices. Mechanical and climatic test methods General
Released: 2003-07-07
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
BS EN 60191-6-10:2003
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Released: 2004-03-31
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Released: 2018-04-18
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
English Secure PDF
Immediate download
268.62 EUR
English Hardcopy
In stock
268.62 EUR
English Secure PDF
Immediate download
191.18 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.12 EUR
You can read the standard for 24 hours. More information in the category: E-reading
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57.35 EUR
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191.18 EUR
PD IEC TR 63378-1:2021
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Released: 2022-01-11
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Released: 2021-11-05
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312.18 EUR
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31.22 EUR
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93.65 EUR
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312.18 EUR
BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Released: 2020-09-09
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266.20 EUR
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26.62 EUR
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Reading the standardfor 24 hours
79.86 EUR
English Hardcopy
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266.20 EUR