PRICES include / exclude VAT
31.080.01 Semiconductor devices in general
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Released: 2001-03-15
English Secure PDF
Immediate download
160.80 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
16.08 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
48.24 EUR
English Hardcopy
In stock
160.80 EUR
English Secure PDF
Immediate download
24.00 EUR
English Hardcopy
In stock
24.00 EUR
English Secure PDF
Immediate download
264.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.40 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
79.20 EUR
English Hardcopy
In stock
264.00 EUR
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
English Secure PDF
Immediate download
348.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
34.80 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
104.40 EUR
English Hardcopy
In stock
348.00 EUR
BS EN 62415:2010
Semiconductor devices. Constant current electromigration test
Semiconductor devices. Constant current electromigration test
Released: 2010-07-31
English Secure PDF
Immediate download
160.80 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
16.08 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
48.24 EUR
English Hardcopy
In stock
160.80 EUR
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Released: 2018-04-18
English Secure PDF
Immediate download
160.80 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
16.08 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
48.24 EUR
English Hardcopy
In stock
160.80 EUR
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Released: 2011-09-30
English Secure PDF
Immediate download
264.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.40 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
79.20 EUR
English Hardcopy
In stock
264.00 EUR
BS EN 62418:2010
Semiconductor devices. Metallization stress void test
Semiconductor devices. Metallization stress void test
Released: 2010-08-31
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
English Secure PDF
Immediate download
396.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
39.60 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
118.80 EUR
English Hardcopy
In stock
396.00 EUR
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR