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31.080.01 Semiconductor devices in general
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure
Environmental testing Tests. Test M: Low air pressure
Released: 2021-04-26
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS IEC 796-1:1990
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Released: 1991-02-28
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348.00 EUR
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34.80 EUR
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104.40 EUR
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348.00 EUR
BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Released: 2004-06-22
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Released: 2014-10-31
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods External visual examination
Released: 2017-11-24
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN IEC 60749-26:2018 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2020-02-27
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516.00 EUR
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516.00 EUR
BS IEC 60747-18-2:2020
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
Released: 2020-02-21
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189.60 EUR
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56.88 EUR
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189.60 EUR
24/30491834 DC
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Released: 2024-04-23
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24.00 EUR
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24.00 EUR
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
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348.00 EUR
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34.80 EUR
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Reading the standardfor 24 hours
104.40 EUR
English Hardcopy
In stock
348.00 EUR