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31.080.01 Semiconductor devices in general
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BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Released: 2020-10-14
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS IEC 60747-5-4:2022
Semiconductor devices Optoelectronic devices. Semiconductor lasers
Semiconductor devices Optoelectronic devices. Semiconductor lasers
Released: 2022-06-20
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312.18 EUR
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31.22 EUR
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93.65 EUR
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312.18 EUR
BS EN IEC 60749-10:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-09-15
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268.62 EUR
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268.62 EUR
BS EN IEC 60749-28:2022
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Released: 2022-09-06
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370.26 EUR
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37.03 EUR
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111.08 EUR
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370.26 EUR
23/30473272 DC
BS IEC 60747-5-4 AMD 1. Semiconductor devices Part 5-4. Optoelectronic devices. Semiconductor lasers
BS IEC 60747-5-4 AMD 1. Semiconductor devices Part 5-4. Optoelectronic devices. Semiconductor lasers
Released: 2023-04-26
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23/30472390 DC
BS EN 60747-16-11 Semiconductor devices Part 16-11. Microwave integrated circuits - Power detectors
BS EN 60747-16-11 Semiconductor devices Part 16-11. Microwave integrated circuits - Power detectors
Released: 2023-04-04
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BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Released: 2023-05-23
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
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24.20 EUR
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24.20 EUR
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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Released: 2023-08-31
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266.20 EUR
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26.62 EUR
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79.86 EUR
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PD ES 59008-5-2:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Released: 2001-06-15
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
13/30290462 DC
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
Released: 2013-09-10
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24.20 EUR