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31.080.01 Semiconductor devices in general
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BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-08-16
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178.50 EUR
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Reading the standardfor 1 hour
17.85 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Released: 2018-04-18
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149.94 EUR
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Reading the standardfor 1 hour
14.99 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
44.98 EUR
English Hardcopy
In stock
149.94 EUR
BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Released: 2018-04-30
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178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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17.85 EUR
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Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR
BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Released: 2020-10-01
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178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
17.85 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR
BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2020-02-24
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195.16 EUR
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195.16 EUR
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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Immediate download
149.94 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
14.99 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
44.98 EUR
English Hardcopy
In stock
149.94 EUR
BS EN IEC 60749-18:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2020-02-24
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323.68 EUR
English Secure PDF
Immediate download
323.68 EUR
English Hardcopy
In stock
323.68 EUR
English Hardcopy
In stock
323.68 EUR
BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2019-06-10
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247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.26 EUR
English Hardcopy
In stock
247.52 EUR
BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Released: 2020-10-14
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247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.26 EUR
English Hardcopy
In stock
247.52 EUR
BS EN IEC 60749-26:2018 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2020-02-27
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449.82 EUR
English Hardcopy
In stock
449.82 EUR
BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2018-04-30
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Immediate download
345.10 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
34.51 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
103.53 EUR
English Hardcopy
In stock
345.10 EUR
English Secure PDF
Immediate download
449.82 EUR
English Hardcopy
In stock
449.82 EUR