PRICES include / exclude VAT
31.080.01 Semiconductor devices in general
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
English Secure PDF
Immediate download
23.00 EUR
English Hardcopy
In stock
23.00 EUR
English Secure PDF
Immediate download
253.00 EUR
English Hardcopy
In stock
253.00 EUR
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
English Secure PDF
Immediate download
333.50 EUR
English Hardcopy
In stock
333.50 EUR
PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
English Secure PDF
Immediate download
154.10 EUR
English Hardcopy
In stock
154.10 EUR
English Secure PDF
Immediate download
181.70 EUR
English Hardcopy
In stock
181.70 EUR
PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Released: 2001-03-15
English Secure PDF
Immediate download
154.10 EUR
English Hardcopy
In stock
154.10 EUR
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
English Secure PDF
Immediate download
379.50 EUR
English Hardcopy
In stock
379.50 EUR
English Secure PDF
Immediate download
23.00 EUR
English Hardcopy
In stock
23.00 EUR
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
English Secure PDF
Immediate download
181.70 EUR
English Hardcopy
In stock
181.70 EUR
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
English Secure PDF
Immediate download
181.70 EUR
English Hardcopy
In stock
181.70 EUR
BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
Semiconductor devices. Mechanical and climatic test methods General
Released: 2003-07-07
English Secure PDF
Immediate download
154.10 EUR
English Hardcopy
In stock
154.10 EUR
BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Released: 2003-10-24
English Secure PDF
Immediate download
154.10 EUR
English Hardcopy
In stock
154.10 EUR