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BS IEC 60747-4:2007+A1:2017
Semiconductor devices. Discrete devices Microwave diodes and transistors
Semiconductor devices. Discrete devices Microwave diodes and transistors
Released: 2020-05-26
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396.00 EUR
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39.60 EUR
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118.80 EUR
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396.00 EUR
BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Released: 2019-11-22
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396.00 EUR
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39.60 EUR
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118.80 EUR
English Hardcopy
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396.00 EUR
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
Released: 2023-03-30
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Released: 2021-09-08
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
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189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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18.96 EUR
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56.88 EUR
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189.60 EUR
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 2006-09-29
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
17/30366375 DC
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
Released: 2017-11-30
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24.00 EUR
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24.00 EUR
BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
Semiconductor devices. Hot carrier test on MOS transistors
Released: 2010-07-31
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
English Secure PDF
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189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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18.96 EUR
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Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
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189.60 EUR