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BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
Semiconductor devices. Hot carrier test on MOS transistors
Released: 2010-07-31
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
17/30366375 DC
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
Released: 2017-11-30
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24.20 EUR
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In stock
24.20 EUR
English Secure PDF
Immediate download
191.18 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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191.18 EUR
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19.12 EUR
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57.35 EUR
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In stock
191.18 EUR
English Secure PDF
Immediate download
191.18 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.12 EUR
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Reading the standardfor 24 hours
57.35 EUR
English Hardcopy
In stock
191.18 EUR
BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Released: 2021-09-08
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
Released: 2023-03-30
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
18/30381548 DC
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
Released: 2018-08-03
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24.20 EUR
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24.20 EUR
BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Released: 2010-06-30
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
BS IEC 62899-503-1:2020
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Released: 2020-09-25
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS IEC 60747-8-4:2004
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
Released: 2004-11-09
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370.26 EUR
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37.03 EUR
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Reading the standardfor 24 hours
111.08 EUR
English Hardcopy
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370.26 EUR