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31.080.30 Transistors
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BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
Semiconductor devices. Hot carrier test on MOS transistors
Released: 2010-07-31
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154.10 EUR
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154.10 EUR
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181.70 EUR
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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253.00 EUR
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253.00 EUR
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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 2006-09-29
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