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19 results
First pagePrev12BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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56.88 EUR
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189.60 EUR
18/30381548 DC
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
Released: 2018-08-03
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24.00 EUR
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24.00 EUR
BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Released: 2010-06-30
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS IEC 60747-8-4:2004
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
Released: 2004-11-09
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367.20 EUR
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36.72 EUR
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110.16 EUR
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BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices Bipolar transistors
Semiconductor devices. Discrete devices Bipolar transistors
Released: 2019-10-23
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396.00 EUR
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BS IEC 60747-8:2010+A1:2021
Semiconductor devices. Discrete devices Field-effect transistors
Semiconductor devices. Discrete devices Field-effect transistors
Released: 2021-07-09
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396.00 EUR
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39.60 EUR
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118.80 EUR
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396.00 EUR
BS IEC 62899-503-1:2020
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Released: 2020-09-25
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189.60 EUR
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19 results
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