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BS EN 62258-5:2006
Semiconductor die products Requirements for information concerning electrical simulation
Semiconductor die products Requirements for information concerning electrical simulation
Released: 2006-11-30
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188.02 EUR
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18.80 EUR
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56.41 EUR
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188.02 EUR
BS EN 62258-2:2011
Semiconductor die products Exchange data formats
Semiconductor die products Exchange data formats
Released: 2011-07-31
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392.70 EUR
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39.27 EUR
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117.81 EUR
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392.70 EUR
PD CLC/TR 62258-4:2013
Semiconductor die products Questionnaire for die users and suppliers
Semiconductor die products Questionnaire for die users and suppliers
Released: 2014-11-30
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307.02 EUR
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30.70 EUR
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92.11 EUR
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307.02 EUR
BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Released: 2019-04-16
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188.02 EUR
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18.80 EUR
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56.41 EUR
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188.02 EUR
BS IEC 62047-31:2019
Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
Released: 2019-04-17
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188.02 EUR
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18.80 EUR
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56.41 EUR
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188.02 EUR
BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Released: 2019-04-18
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261.80 EUR
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26.18 EUR
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78.54 EUR
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261.80 EUR
BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Released: 2011-06-30
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188.02 EUR
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18.80 EUR
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56.41 EUR
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188.02 EUR
PD IEC/TR 62258-8:2008
Semiconductor die products EXPRESS model schema for data exchange
Semiconductor die products EXPRESS model schema for data exchange
Released: 2008-09-30
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261.80 EUR
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26.18 EUR
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78.54 EUR
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261.80 EUR
BS EN 62047-12:2011
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Released: 2011-11-30
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307.02 EUR
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30.70 EUR
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92.11 EUR
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307.02 EUR
English Secure PDF
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261.80 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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26.18 EUR
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78.54 EUR
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261.80 EUR
BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
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188.02 EUR
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18.80 EUR
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Reading the standardfor 24 hours
56.41 EUR
English Hardcopy
In stock
188.02 EUR
English Secure PDF
Immediate download
261.80 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.18 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
78.54 EUR
English Hardcopy
In stock
261.80 EUR