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BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Released: 2019-03-05
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Immediate download
178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
17.85 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR
BS IEC 62951-6:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
Released: 2019-05-15
English Secure PDF
Immediate download
247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.26 EUR
English Hardcopy
In stock
247.52 EUR
English Secure PDF
Immediate download
178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
17.85 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR
BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
English Secure PDF
Immediate download
178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
17.85 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR
English Secure PDF
Immediate download
178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
17.85 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR
BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Released: 2019-05-10
English Secure PDF
Immediate download
247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.26 EUR
English Hardcopy
In stock
247.52 EUR
English Secure PDF
Immediate download
247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.26 EUR
English Hardcopy
In stock
247.52 EUR
English Secure PDF
Immediate download
247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.26 EUR
English Hardcopy
In stock
247.52 EUR
English Secure PDF
Immediate download
247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.26 EUR
English Hardcopy
In stock
247.52 EUR
English Secure PDF
Immediate download
290.36 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
29.04 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
87.11 EUR
English Hardcopy
In stock
290.36 EUR
BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Released: 2023-08-31
English Secure PDF
Immediate download
247.52 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
24.75 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
74.26 EUR
English Hardcopy
In stock
247.52 EUR
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
English Secure PDF
Immediate download
178.50 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
17.85 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
53.55 EUR
English Hardcopy
In stock
178.50 EUR