PRICES include / exclude VAT
31.080.99 Other semiconductor devices
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Released: 2023-03-27
English Secure PDF
Immediate download
188.02 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.80 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.41 EUR
English Hardcopy
In stock
188.02 EUR
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
English Secure PDF
Immediate download
188.02 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.80 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.41 EUR
English Hardcopy
In stock
188.02 EUR
English Secure PDF
Immediate download
23.80 EUR
English Hardcopy
In stock
23.80 EUR
24/30500239 DC
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
Released: 2024-09-13
English Secure PDF
Immediate download
23.80 EUR
English Hardcopy
In stock
23.80 EUR
24/30499096 DC
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)
Released: 2024-10-04
English Secure PDF
Immediate download
23.80 EUR
English Hardcopy
In stock
23.80 EUR
24/30500231 DC
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
Released: 2024-09-13
English Secure PDF
Immediate download
23.80 EUR
English Hardcopy
In stock
23.80 EUR
English Secure PDF
Immediate download
23.80 EUR
English Hardcopy
In stock
23.80 EUR