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BS IEC 62047-44:2024
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
Released: 2024-02-29
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181.50 EUR
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18.15 EUR
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Reading the standardfor 24 hours
54.45 EUR
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181.50 EUR
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24.20 EUR
English Hardcopy
In stock
24.20 EUR
English Secure PDF
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24.20 EUR
English Hardcopy
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24.20 EUR
BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Released: 2006-01-23
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Released: 2003-01-17
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312.18 EUR
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31.22 EUR
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93.65 EUR
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312.18 EUR
BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Released: 2014-10-31
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162.14 EUR
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16.21 EUR
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48.64 EUR
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162.14 EUR
BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Released: 1987-10-30
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399.30 EUR
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39.93 EUR
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Reading the standardfor 24 hours
119.79 EUR
English Hardcopy
In stock
399.30 EUR
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162.14 EUR
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16.21 EUR
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Reading the standardfor 24 hours
48.64 EUR
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162.14 EUR
BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Released: 2001-05-15
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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266.20 EUR
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN 62047-9:2011
Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS
Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS
Released: 2013-01-31
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266.20 EUR
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26.62 EUR
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Reading the standardfor 24 hours
79.86 EUR
English Hardcopy
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266.20 EUR