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BS EN IEC 60747-15:2024 - TC
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Released: 2024-12-20
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511.70 EUR
24/30497861 DC
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
Released: 2024-08-01
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BS EN 60464-2:2001
Varnishes used for electrical insulation Methods of test
Varnishes used for electrical insulation Methods of test
Released: 2007-02-28
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78.54 EUR
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BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c. converters
Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c. converters
Released: 2000-08-15
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345.10 EUR
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103.53 EUR
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345.10 EUR
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
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392.70 EUR
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117.81 EUR
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BS EN 60747-16-3:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Frequency converters
Semiconductor devices Microwave integrated circuits. Frequency converters
Released: 2018-02-23
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109.24 EUR
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364.14 EUR
PD CLC/TR 62258-3:2007
Semiconductor die products Recommendations for good practice in handling, packing and storage
Semiconductor die products Recommendations for good practice in handling, packing and storage
Released: 2008-05-31
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345.10 EUR
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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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BS EN 60747-16-4:2004+A2:2017
Semiconductor devices Microwave integrated circuits. Switches
Semiconductor devices Microwave integrated circuits. Switches
Released: 2018-03-16
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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Released: 2013-10-31
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188.02 EUR
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188.02 EUR
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26.18 EUR
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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Released: 2012-05-31
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188.02 EUR
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56.41 EUR
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188.02 EUR