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188.02 EUR
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18.80 EUR
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56.41 EUR
English Hardcopy
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188.02 EUR
BS EN IEC 62031:2020+A11:2021
LED modules for general lighting. Safety specifications
LED modules for general lighting. Safety specifications
Released: 2022-03-31
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261.80 EUR
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26.18 EUR
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78.54 EUR
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261.80 EUR
BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Released: 2021-11-05
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307.02 EUR
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30.70 EUR
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92.11 EUR
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307.02 EUR
English Secure PDF
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23.80 EUR
English Hardcopy
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23.80 EUR
BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Released: 2023-05-23
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56.41 EUR
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188.02 EUR
23/30479765 DC
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Released: 2023-09-25
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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Released: 2023-08-31
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26.18 EUR
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78.54 EUR
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261.80 EUR
English Secure PDF
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188.02 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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18.80 EUR
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56.41 EUR
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188.02 EUR
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23.80 EUR
English Hardcopy
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23.80 EUR
BS IEC 62047-47:2024
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures
Released: 2024-08-28
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56.41 EUR
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188.02 EUR
24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
Released: 2024-08-16
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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Released: 1987-10-30
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392.70 EUR
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39.27 EUR
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117.81 EUR
English Hardcopy
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392.70 EUR