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BS IEC 60747-5-8:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
Released: 2019-11-27
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Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
BS IEC 60747-5-11:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
Released: 2020-01-14
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
BS IEC 62047-42:2022
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
Released: 2022-10-24
English Secure PDF
Immediate download
264.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.40 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
79.20 EUR
English Hardcopy
In stock
264.00 EUR
BS IEC 62047-40:2021
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
Released: 2021-09-14
English Secure PDF
Immediate download
160.80 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
16.08 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
48.24 EUR
English Hardcopy
In stock
160.80 EUR
PD IEC TS 60747-19-2:2021
Semiconductor devices Smart sensors. Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
Semiconductor devices Smart sensors. Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
Released: 2021-07-02
English Secure PDF
Immediate download
264.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.40 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
79.20 EUR
English Hardcopy
In stock
264.00 EUR
BS IEC 62047-38:2021
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Released: 2021-07-07
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
English Secure PDF
Immediate download
309.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
30.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
92.88 EUR
English Hardcopy
In stock
309.60 EUR
English Secure PDF
Immediate download
24.00 EUR
English Hardcopy
In stock
24.00 EUR
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR
English Secure PDF
Immediate download
189.60 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
18.96 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
56.88 EUR
English Hardcopy
In stock
189.60 EUR