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31.140 Piezoelectric and dielectric devices
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BS EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Released: 1998-05-15
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN 60679-4-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Released: 1998-06-15
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
BS EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Released: 2017-12-13
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309.60 EUR
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30.96 EUR
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92.88 EUR
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309.60 EUR
English Secure PDF
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396.00 EUR
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39.60 EUR
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118.80 EUR
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396.00 EUR
BS EN IEC 63041-3:2020
Piezoelectric sensors Physical sensors
Piezoelectric sensors Physical sensors
Released: 2020-10-01
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Released: 2021-11-05
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN IEC 61837-2:2018+A1:2020
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Ceramic enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Ceramic enclosures
Released: 2020-11-13
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396.00 EUR
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39.60 EUR
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118.80 EUR
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396.00 EUR
BS EN IEC 62604-2:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Released: 2022-10-31
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309.60 EUR
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30.96 EUR
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92.88 EUR
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309.60 EUR
BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
Quartz crystal units of assessed quality Generic specification
Released: 2018-05-21
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348.00 EUR
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34.80 EUR
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104.40 EUR
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348.00 EUR
BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Released: 1991-05-31
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR