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BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Released: 2019-04-18
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Released: 2019-04-16
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Released: 1995-04-15
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Released: 1993-09-15
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189.60 EUR
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18.96 EUR
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56.88 EUR
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189.60 EUR
English Secure PDF
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160.80 EUR
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16.08 EUR
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48.24 EUR
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160.80 EUR
English Secure PDF
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367.20 EUR
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36.72 EUR
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110.16 EUR
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367.20 EUR
BS EN 61837-3:2015
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Released: 2015-12-31
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264.00 EUR
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26.40 EUR
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79.20 EUR
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264.00 EUR
BS EN 60758:2016
Synthetic quartz crystal. Specifications and guidelines for use
Synthetic quartz crystal. Specifications and guidelines for use
Released: 2016-09-30
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367.20 EUR
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36.72 EUR
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110.16 EUR
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367.20 EUR
BS EN 60758:2016 - TC
Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
Released: 2020-02-26
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516.00 EUR
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516.00 EUR
BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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189.60 EUR
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18.96 EUR
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56.88 EUR
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23/30472821 DC
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
Released: 2023-04-12
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24.00 EUR
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24.00 EUR
23/30468947 DC
BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2023-01-30
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24.00 EUR
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24.00 EUR