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Homepage>BS Standards>31 ELECTRONICS>31.140 Piezoelectric and dielectric devices

31.140 Piezoelectric and dielectric devices

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110 results
First page124678910Last page
BS EN IEC 62604-1:2022 - TC
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2023-01-23
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24/30492753 DC
BS EN IEC 63541. Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications. Specifications and measuring method
Released: 2024-05-09
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24/30501926 DC
BS EN IEC 60444-11 Measurement of quartz crystal unit parameters Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Released: 2024-10-11
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BS EN 60444-1:1997
Measurement of quartz crystal unit parameters Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network
Released: 2000-08-15
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BS EN 60862-2:2012
Surface acoustic wave (SAW) filters of assessed quality Guidelines for the use
Released: 2012-08-31
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BS EN 50324-1:2002
Piezoelectric properties of ceramic materials and components Terms and definitions
Released: 2002-10-10
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BS EN 60679-5-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Qualification approval
Released: 1998-11-15
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BS CECC 68100:1991
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Released: 1991-01-31
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BS EN 61338-1-4:2006
Waveguide type dielectric resonators General information and test conditions. Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
Released: 2007-12-31
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PD IEC TS 61994-4-1:2018
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric materials. Synthetic quartz crystal
Released: 2018-11-22
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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
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BS EN 168101:1997
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
Released: 1990-12-31
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110 results
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