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31.140 Piezoelectric and dielectric devices
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BS EN 62884-2:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
Released: 2017-12-08
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26.62 EUR
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79.86 EUR
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266.20 EUR
BS EN 60793-1-33:2017 - TC
Tracked Changes. Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
Tracked Changes. Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
Released: 2020-02-25
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491.26 EUR
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491.26 EUR
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268.62 EUR
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268.62 EUR
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227.48 EUR
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227.48 EUR
BS EN 61029-1:2009+A11:2010
Safety of transportable motor-operated electric tools General requirements
Safety of transportable motor-operated electric tools General requirements
Released: 2011-06-30
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399.30 EUR
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39.93 EUR
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119.79 EUR
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399.30 EUR
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399.30 EUR
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39.93 EUR
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119.79 EUR
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399.30 EUR
BS EN 60368-4:2001
Piezoelectric filters Sectional specification. Capability approval
Piezoelectric filters Sectional specification. Capability approval
Released: 2001-06-15
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26.62 EUR
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79.86 EUR
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BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Released: 1991-05-31
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191.18 EUR
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19.12 EUR
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57.35 EUR
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191.18 EUR
BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
Quartz crystal units of assessed quality Generic specification
Released: 2018-05-21
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350.90 EUR
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35.09 EUR
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105.27 EUR
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350.90 EUR
BS EN 60122-3:2010
Quartz crystal units of assessed quality Standard outlines and lead connections
Quartz crystal units of assessed quality Standard outlines and lead connections
Released: 2011-02-28
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79.86 EUR
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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191.18 EUR
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19.12 EUR
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57.35 EUR
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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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79.86 EUR
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266.20 EUR