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31.140 Piezoelectric and dielectric devices
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BS EN 62276:2016
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2016-12-31
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333.50 EUR
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333.50 EUR
BS EN 61338-4-1:2005
Waveguide type dielectric resonators Blank detail specification
Waveguide type dielectric resonators Blank detail specification
Released: 2005-12-16
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154.10 EUR
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154.10 EUR
BS EN 60689:2009
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Released: 2009-04-30
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253.00 EUR
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253.00 EUR
BS EN 60679-3:2013
Quartz crystal controlled oscillators of assessed quality Standard outlines and lead connections
Quartz crystal controlled oscillators of assessed quality Standard outlines and lead connections
Released: 2013-07-31
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253.00 EUR
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BS EN 169100:1993
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
Released: 1993-08-15
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BS EN IEC 62884-3:2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Frequency aging test methods
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Frequency aging test methods
Released: 2018-05-30
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181.70 EUR
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181.70 EUR
BS EN 62761:2014
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
Released: 2014-06-30
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253.00 EUR
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BS EN 60444-8:2017
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Released: 2017-05-26
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181.70 EUR
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181.70 EUR
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253.00 EUR
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253.00 EUR
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181.70 EUR
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181.70 EUR
BS EN IEC 63041-1:2021 - TC
Tracked Changes. Piezoelectric sensors Generic specifications
Tracked Changes. Piezoelectric sensors Generic specifications
Released: 2022-02-08
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416.30 EUR
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BS EN IEC 60444-6:2021 - TC
Tracked Changes. Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Tracked Changes. Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Released: 2022-05-18
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354.20 EUR
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