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31.200 Integrated circuits. Microelectronics

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BS CECC 90104:1981
Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB

Released: 1981-11-15

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BS EN 60747-16-10:2004
Semiconductor devices Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

Released: 2004-11-09

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BS EN 62132-5:2006
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Workbench Faraday cage method

Released: 2006-03-31

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BS EN IEC 62228-1:2018
Integrated circuits. EMC evaluation of transceivers General conditions and definitions

Released: 2018-06-12

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BS QC 790130:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)

Released: 1992-05-15

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BS QC 790110:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits

Released: 1992-05-15

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BS EN IEC 61967-8:2023 - TC
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method

Released: 2023-06-26

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BS IEC 61523-1:2023
Delay and power calculation standards Integrated Circuit (IC) Open Library Architecture (OLA)

Released: 2024-02-12

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24/30501110 DC
BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity - IC stripline method

Released: 2024-09-27

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PD IEC/TS 61967-3:2014
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method

Released: 2014-09-30

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BS IEC 60748-4-3:2006
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)

Released: 2007-02-28

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BS QC 790105:1993
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories

Released: 1992-02-15

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131 results

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