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181.70 EUR
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BS EN IEC 61967-1:2019
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
Released: 2019-02-21
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253.00 EUR
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BS EN 165000-4:1996
Film and hybrid integrated circuits Customer information, product assessment level schedules and blank detail specification
Film and hybrid integrated circuits Customer information, product assessment level schedules and blank detail specification
Released: 1996-10-15
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351.90 EUR
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351.90 EUR
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181.70 EUR
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BS EN 165000-3:1996
Film and hybrid integrated circuits Self-audit checklist and report for film and hybrid integrated circuit manufacturers
Film and hybrid integrated circuits Self-audit checklist and report for film and hybrid integrated circuit manufacturers
Released: 1996-10-15
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BS EN 190110:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits
Released: 1993-12-15
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181.70 EUR
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181.70 EUR
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BS EN 62433-4:2016
EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
Released: 2016-11-30
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BS EN 62132-4:2006
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
Released: 2006-07-31
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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Released: 2014-09-30
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BS IEC 62528:2007
Standard testability method for embedded core-based integrated circuits
Standard testability method for embedded core-based integrated circuits
Released: 2007-12-31
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