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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics

31.200 Integrated circuits. Microelectronics

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131 results
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BS QC 760101:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
Released: 1997-08-15
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BS QC 790132:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
Released: 1992-01-31
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BS EN 190110:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits
Released: 1993-12-15
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BS EN 165000-5:1998
Film and hybrid integrated circuits Procedure for qualification approval
Released: 1998-03-15
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BS EN 190103:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS
Released: 1983-01-15
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BS EN 62132-4:2006
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
Released: 2006-07-31
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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Released: 2014-09-30
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BS EN 62433-4:2016
EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
Released: 2016-11-30
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BS EN 62132-2:2011
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method
Released: 2011-04-30
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BS EN IEC 61967-1:2019
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
Released: 2019-02-21
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BS EN 62132-8:2012
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
Released: 2012-10-31
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BS EN IEC 61967-1:2019 - TC
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
Released: 2020-02-24
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131 results
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