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PD ISO/TR 14187:2020
Surface chemical analysis. Characterization of nanostructured materials
Surface chemical analysis. Characterization of nanostructured materials
Released: 2020-07-03
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BS ISO 6142-2:2024
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Released: 2024-02-07
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74.88 EUR
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BS ISO 20579-1:2024
Surface chemical analysis. Sample handling, preparation and mounting Documenting and reporting the handling of specimens prior to analysis
Surface chemical analysis. Sample handling, preparation and mounting Documenting and reporting the handling of specimens prior to analysis
Released: 2024-09-24
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BS ISO 7431-1:2024
Thiourea for industrial use Test methods
Thiourea for industrial use Test methods
Released: 2024-01-24
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54.00 EUR
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BS 6337-3:1983
General methods of chemical analysis Method for determination of iron content (1,10-phenanthroline spectrophotometric method)
General methods of chemical analysis Method for determination of iron content (1,10-phenanthroline spectrophotometric method)
Released: 1983-01-31
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15.12 EUR
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45.36 EUR
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BS ISO 16129:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Released: 2018-11-19
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BS 6337-4:1984
General methods of chemical analysis Method for determination of chloride ions by potentiometry
General methods of chemical analysis Method for determination of chloride ions by potentiometry
Released: 1984-01-31
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BS EN ISO 6145-9:2010
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
Released: 2011-02-28
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BS EN ISO 15796:2008
Gas analysis. Investigation and treatment of analytical bias
Gas analysis. Investigation and treatment of analytical bias
Released: 2009-06-30
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BS EN 60746-1:2003
Expression of performance of electrochemical analyzers General
Expression of performance of electrochemical analyzers General
Released: 2003-04-23
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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Released: 2019-05-14
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87.84 EUR
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