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71.040.40 Chemical analysis
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BS ISO 18337:2015
Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
Released: 2015-06-30
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178.50 EUR
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17.85 EUR
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53.55 EUR
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178.50 EUR
BS ISO 18516:2006
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
Released: 2006-11-30
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290.36 EUR
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29.04 EUR
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87.11 EUR
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290.36 EUR
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247.52 EUR
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24.75 EUR
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74.26 EUR
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247.52 EUR
BS ISO 19229:2019 - TC
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Released: 2020-02-24
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323.68 EUR
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BS ISO 19229:2019
Gas analysis. Purity analysis and the treatment of purity data
Gas analysis. Purity analysis and the treatment of purity data
Released: 2019-07-26
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247.52 EUR
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24.75 EUR
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74.26 EUR
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BS ISO 19230:2020
Gas analysis. Sampling guidelines
Gas analysis. Sampling guidelines
Released: 2020-12-02
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345.10 EUR
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34.51 EUR
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103.53 EUR
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345.10 EUR
BS ISO 19318:2021 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-10-12
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BS ISO 19318:2021
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-06-16
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247.52 EUR
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24.75 EUR
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74.26 EUR
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BS ISO 19668:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
Released: 2017-09-18
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247.52 EUR
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24.75 EUR
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74.26 EUR
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247.52 EUR
BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Released: 2015-11-30
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290.36 EUR
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29.04 EUR
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87.11 EUR
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290.36 EUR
BS ISO 20289:2018
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Released: 2018-03-23
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247.52 EUR
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24.75 EUR
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74.26 EUR
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247.52 EUR
BS ISO 20341:2003
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Released: 2003-08-08
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149.94 EUR
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14.99 EUR
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44.98 EUR
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149.94 EUR