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71.040.40 Chemical analysis
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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Released: 2009-05-31
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24.75 EUR
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74.26 EUR
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BS ISO 23830:2008
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Released: 2008-12-31
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24.75 EUR
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74.26 EUR
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BS ISO 24236:2005
Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-05-12
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24.75 EUR
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74.26 EUR
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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-09-11
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178.50 EUR
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17.85 EUR
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53.55 EUR
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BS ISO 24417:2022
Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
Released: 2022-10-31
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328.44 EUR
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98.53 EUR
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BS ISO 24465:2023
Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
Released: 2023-01-26
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178.50 EUR
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BS ISO 27911:2011
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Released: 2011-08-31
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BS ISO 28600:2011
Surface chemical analysis. Data transfer format for scanning-probe microscopy
Surface chemical analysis. Data transfer format for scanning-probe microscopy
Released: 2011-07-31
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290.36 EUR
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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2010-02-28
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290.36 EUR
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29.04 EUR
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87.11 EUR
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BS ISO 5861:2024
Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
Released: 2024-06-13
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290.36 EUR
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29.04 EUR
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87.11 EUR
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290.36 EUR
BS ISO 6142-1:2015+A1:2020
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Released: 2022-11-08
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328.44 EUR
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32.84 EUR
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98.53 EUR
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BS ISO 6142-2:2024
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Released: 2024-02-07
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247.52 EUR
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24.75 EUR
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74.26 EUR
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