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71.040.40 Chemical analysis
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BS EN 12698-2:2007
Chemical analysis of nitride bonded silicon carbide refractories XRD methods
Chemical analysis of nitride bonded silicon carbide refractories XRD methods
Released: 2007-05-31
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56.88 EUR
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189.60 EUR
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18.96 EUR
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56.88 EUR
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BS EN 61207-6:2015
Expression of performance of gas analyzers Photometric analyzers
Expression of performance of gas analyzers Photometric analyzers
Released: 2015-01-31
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BS EN ISO 6145-10:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Released: 2009-02-28
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BS 5443:1977
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
Released: 1977-11-30
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BS ISO 14237:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Released: 2010-08-31
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BS ISO 18516:2006
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
Released: 2006-11-30
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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-09-11
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BS EN ISO 6145-6:2017
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Critical flow orifices
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Critical flow orifices
Released: 2017-09-04
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PD ISO/TR 22335:2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Released: 2007-08-31
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BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Released: 2005-03-31
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