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71.040.40 Chemical analysis
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266.20 EUR
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79.86 EUR
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266.20 EUR
BS ISO 13084:2018
Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Released: 2018-11-16
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79.86 EUR
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BS EN IEC 61207-2:2019
Expression of performance of gas analyzers Measuring oxygen in gas utilizing high-temperature electrochemical sensors
Expression of performance of gas analyzers Measuring oxygen in gas utilizing high-temperature electrochemical sensors
Released: 2019-09-12
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79.86 EUR
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BS ISO 7504:2015 - TC
Tracked Changes. Gas analysis. Vocabulary
Tracked Changes. Gas analysis. Vocabulary
Released: 2020-02-27
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BS EN ISO 6142-1:2015 - TC
Tracked Changes. Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Tracked Changes. Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Released: 2020-02-26
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BS ISO 10810:2019 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Released: 2020-02-24
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438.02 EUR
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BS EN IEC 61207-3:2019 - TC
Tracked Changes. Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Tracked Changes. Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Released: 2020-02-24
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372.68 EUR
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BS ISO 19229:2019 - TC
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Released: 2020-02-24
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BS EN ISO 6141:2015+A1:2020
Gas analysis. Contents of certificates for calibration gas mixtures
Gas analysis. Contents of certificates for calibration gas mixtures
Released: 2020-03-10
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48.64 EUR
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BS ISO 14701:2018 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2020-02-27
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English Secure PDF
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372.68 EUR
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372.68 EUR