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71.040.40 Chemical analysis
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-03-26
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BS ISO 19318:2021
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-06-16
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BS ISO 7431-1:2024
Thiourea for industrial use Test methods
Thiourea for industrial use Test methods
Released: 2024-01-24
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BS ISO 6142-2:2024
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Released: 2024-02-07
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BS ISO 23729:2022
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Released: 2022-08-03
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BS ISO 20579-1:2024
Surface chemical analysis. Sample handling, preparation and mounting Documenting and reporting the handling of specimens prior to analysis
Surface chemical analysis. Sample handling, preparation and mounting Documenting and reporting the handling of specimens prior to analysis
Released: 2024-09-24
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BS ISO 78-2:1999
Chemistry. Layout for standards Methods of chemical analysis
Chemistry. Layout for standards Methods of chemical analysis
Released: 1999-06-15
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PD IEC/TR 62456:2007
An electrochemical reference system for use in different solvent media. The decamethylated ferricinium/ferrocene redox couple
An electrochemical reference system for use in different solvent media. The decamethylated ferricinium/ferrocene redox couple
Released: 2007-03-29
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BS ISO 15472:2010
Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
Released: 2010-05-31
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