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Homepage>BS Standards>71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.40 Chemical analysis

71.040.40 Chemical analysis

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181 results
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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-09-11
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PD ISO/TR 22335:2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Released: 2007-08-31
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BS EN ISO 6145-11:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Released: 2009-06-30
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PD ISO/TR 19319:2013
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Released: 2013-03-31
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BS ISO 14706:2014
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Released: 2014-07-31
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BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Released: 2005-03-31
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BS EN 16640:2017
Bio-based products. Bio-based carbon content. Determination of the bio-based carbon content using the radiocarbon method
Released: 2018-03-06
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PD IEC/TR 61832:2015
Design and installation of on-line analyser systems. Guide to technical enquiry and bid evaluation
Released: 2015-05-20
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BS ISO 14976:1998
Surface chemical analysis. Data transfer format
Released: 2000-06-15
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BS EN 50436-3:2016
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Released: 2017-01-31
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BS ISO 17331:2004+A1:2010
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Released: 2010-09-30
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BS EN ISO 21079-3:2008
Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP-AES)
Released: 2009-04-30
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56.41 EUR
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181 results
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