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BS ISO 13424:2013
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
Released: 2013-10-31
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348.00 EUR
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34.80 EUR
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104.40 EUR
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348.00 EUR
BS ISO 19668:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
Released: 2017-09-18
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249.60 EUR
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24.96 EUR
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74.88 EUR
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249.60 EUR
BS ISO 17560:2014
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Released: 2014-09-30
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180.00 EUR
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18.00 EUR
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54.00 EUR
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180.00 EUR
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249.60 EUR
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24.96 EUR
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74.88 EUR
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249.60 EUR
BS ISO 23830:2008
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Released: 2008-12-31
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249.60 EUR
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24.96 EUR
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74.88 EUR
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249.60 EUR
BS ISO 16243:2011
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Released: 2011-12-31
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180.00 EUR
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18.00 EUR
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54.00 EUR
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180.00 EUR
PD ISO/TS 18507:2015
Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
Released: 2015-07-31
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292.80 EUR
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29.28 EUR
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87.84 EUR
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292.80 EUR
BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Released: 2015-11-30
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292.80 EUR
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29.28 EUR
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87.84 EUR
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292.80 EUR
BS ISO 11952:2019
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Released: 2019-05-31
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376.80 EUR
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37.68 EUR
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113.04 EUR
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BS EN 61207-6:2015 - TC
Tracked Changes. Expression of performance of gas analyzers Photometric analyzers
Tracked Changes. Expression of performance of gas analyzers Photometric analyzers
Released: 2020-02-26
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350.40 EUR
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PD ISO/TR 15969:2021 - TC
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-06-21
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252.00 EUR
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BS ISO 14707:2021 - TC
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Released: 2021-06-14
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252.00 EUR
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252.00 EUR