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71.040.40 Chemical analysis
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BS ISO 11952:2019
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Released: 2019-05-31
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373.66 EUR
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37.37 EUR
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112.10 EUR
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373.66 EUR
BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Released: 2010-11-30
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24.75 EUR
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74.26 EUR
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247.52 EUR
BS ISO 12963:2017+A1:2020
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Released: 2021-01-08
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290.36 EUR
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29.04 EUR
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87.11 EUR
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290.36 EUR
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247.52 EUR
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24.75 EUR
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74.26 EUR
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247.52 EUR
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323.68 EUR
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BS ISO 13084:2018
Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Released: 2018-11-16
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24.75 EUR
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74.26 EUR
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BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Released: 2014-08-31
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290.36 EUR
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29.04 EUR
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87.11 EUR
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290.36 EUR
BS ISO 13424:2013
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
Released: 2013-10-31
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345.10 EUR
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34.51 EUR
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103.53 EUR
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345.10 EUR
BS ISO 14167:2018
Gas analysis. General quality aspects and metrological traceability of calibration gas mixtures
Gas analysis. General quality aspects and metrological traceability of calibration gas mixtures
Released: 2018-11-28
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247.52 EUR
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24.75 EUR
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74.26 EUR
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BS ISO 14237:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Released: 2010-08-31
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24.75 EUR
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BS ISO 14606:2022 - TC
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Released: 2023-02-17
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BS ISO 14606:2022
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Released: 2023-02-15
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247.52 EUR
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24.75 EUR
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74.26 EUR
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