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71.040.40 Chemical analysis
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BS ISO 14701:2018 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2020-02-27
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BS ISO 14701:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2018-11-05
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24.75 EUR
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74.26 EUR
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247.52 EUR
BS ISO 14706:2014
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Released: 2014-07-31
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290.36 EUR
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29.04 EUR
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87.11 EUR
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BS ISO 14707:2021 - TC
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Released: 2021-06-14
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BS ISO 14707:2021
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Released: 2021-03-12
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17.85 EUR
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53.55 EUR
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BS ISO 14975:2000
Surface chemical analysis. Information formats
Surface chemical analysis. Information formats
Released: 2001-05-15
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24.75 EUR
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74.26 EUR
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BS ISO 14976:1998
Surface chemical analysis. Data transfer format
Surface chemical analysis. Data transfer format
Released: 2000-06-15
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345.10 EUR
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34.51 EUR
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103.53 EUR
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345.10 EUR
BS ISO 15470:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Released: 2017-03-31
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178.50 EUR
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17.85 EUR
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53.55 EUR
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BS ISO 15471:2016 - TC
Tracked Changes. Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
Tracked Changes. Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
Released: 2020-02-26
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BS ISO 15471:2016
Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
Released: 2016-09-30
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178.50 EUR
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17.85 EUR
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53.55 EUR
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BS ISO 15472:2010
Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
Released: 2010-05-31
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290.36 EUR
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29.04 EUR
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87.11 EUR
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290.36 EUR
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323.68 EUR
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