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71.040.40 Chemical analysis
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BS ISO 16129:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Released: 2018-11-19
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243.36 EUR
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24.34 EUR
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73.01 EUR
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243.36 EUR
BS ISO 16242:2011
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Released: 2011-12-31
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175.50 EUR
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17.55 EUR
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52.65 EUR
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175.50 EUR
BS ISO 16243:2011
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Released: 2011-12-31
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175.50 EUR
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17.55 EUR
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52.65 EUR
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175.50 EUR
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285.48 EUR
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28.55 EUR
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85.64 EUR
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285.48 EUR
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243.36 EUR
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24.34 EUR
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73.01 EUR
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243.36 EUR
BS ISO 16962:2017
Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
Released: 2017-03-31
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339.30 EUR
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33.93 EUR
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Reading the standardfor 24 hours
101.79 EUR
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339.30 EUR
English Secure PDF
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318.24 EUR
English Hardcopy
In stock
318.24 EUR
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243.36 EUR
You can read the standard for 1 hour. More information in the category: E-reading
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24.34 EUR
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73.01 EUR
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243.36 EUR
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243.36 EUR
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24.34 EUR
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73.01 EUR
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243.36 EUR
BS ISO 17560:2014
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Released: 2014-09-30
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175.50 EUR
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17.55 EUR
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52.65 EUR
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BS ISO 17862:2022 - TC
Tracked Changes. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Tracked Changes. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Released: 2023-09-29
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318.24 EUR
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318.24 EUR
BS ISO 17862:2022
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Released: 2022-10-31
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243.36 EUR
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24.34 EUR
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73.01 EUR
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243.36 EUR