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24/30465997 DC
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
Released: 2024-01-15
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24/30479937 DC
BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
Released: 2024-06-07
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24.20 EUR
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79.86 EUR
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BS IEC 61624:1997
Guidance on the development of lists of maximum allowable temperatures for polymeric compounds used in electrotechnical equipment
Guidance on the development of lists of maximum allowable temperatures for polymeric compounds used in electrotechnical equipment
Released: 1998-05-15
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BS ISO 19463:2018
Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
Released: 2018-07-30
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BS ISO 25498:2018 - TC
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Released: 2020-02-27
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BS ISO 24173:2024
Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Released: 2024-02-19
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BS ISO 14594:2024
Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Released: 2024-06-10
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BS ISO 22493:2014
Microbeam analysis. Scanning electron microscopy. Vocabulary
Microbeam analysis. Scanning electron microscopy. Vocabulary
Released: 2014-04-30
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