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BS ISO 20263:2017
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
Released: 2018-01-04
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34.51 EUR
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103.53 EUR
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345.10 EUR
BS ISO 22493:2014
Microbeam analysis. Scanning electron microscopy. Vocabulary
Microbeam analysis. Scanning electron microscopy. Vocabulary
Released: 2014-04-30
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24.75 EUR
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74.26 EUR
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BS ISO 23420:2021
Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
Released: 2021-05-05
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290.36 EUR
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29.04 EUR
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87.11 EUR
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BS ISO 23692:2021
Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
Released: 2021-04-20
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178.50 EUR
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BS ISO 23749:2022
Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
Released: 2022-05-11
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BS ISO 24173:2024 - TC
Tracked Changes. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Tracked Changes. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Released: 2024-02-22
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428.40 EUR
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BS ISO 24173:2024
Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Released: 2024-02-19
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328.44 EUR
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98.53 EUR
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BS ISO 24639:2022
Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
Released: 2022-07-21
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24.75 EUR
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74.26 EUR
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BS ISO 25498:2018 - TC
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Released: 2020-02-27
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BS ISO 25498:2018
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Released: 2018-03-23
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328.44 EUR
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32.84 EUR
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98.53 EUR
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328.44 EUR
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449.82 EUR
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BS ISO 29301:2023
Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
Released: 2023-10-26
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345.10 EUR
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34.51 EUR
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103.53 EUR
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345.10 EUR