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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN 60749-5 ed. 2 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.12.2017
CSN EN 60749-5 ed. 2 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

CSN EN 60749-5 ed. 2

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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Number of Standard:CSN EN 60749-5 ed. 2
Category:358799
Pages:20
Released:01.12.2017
Catalog number:503885
DESCRIPTION

CSN EN 60749-5 ed. 2

CSN EN 60749-5 ed. 2 Tato norma poskytuje zkoušku životnosti konstantní teplotou a vlhkostí při elektrické polarizaci za účelem vyhodnocení spolehlivosti nehermeticky zapouzdřených pevnofázových součástek ve vlhkém prostředí. Tato zkouška je považována za destruktivní.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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