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Released: 01.09.2015
CSN EN 62047-17
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
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English Hardcopy
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69.00 EUR
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Number of Standard: | CSN EN 62047-17 |
Category: | 358775 |
Pages: | 36 |
Released: | 01.09.2015 |
Catalog number: | 98268 |
DESCRIPTION
CSN EN 62047-17
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.