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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3584 Piezoelectric components and ferrite cores>CSN EN 62884-2 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
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Released: 01.04.2018
CSN EN 62884-2 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

CSN EN 62884-2

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

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Number of Standard:CSN EN 62884-2
Category:358492
Pages:36
Released:01.04.2018
Catalog number:504088
DESCRIPTION

CSN EN 62884-2

CSN EN 62884-2 This part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. NOTE: Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.