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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN IEC 60749-12 ed. 2 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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Released: 01.08.2018
CSN EN IEC 60749-12 ed. 2 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

CSN EN IEC 60749-12 ed. 2

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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Number of Standard:CSN EN IEC 60749-12 ed. 2
Category:358799
Pages:16
Released:01.08.2018
Catalog number:505481
DESCRIPTION

CSN EN IEC 60749-12 ed. 2

CSN EN IEC 60749-12 ed. 2 Tato část normy IEC 60749 popisuje zkoušku pro stanovení vlivu vibrací s proměnlivým kmitočtem ve stanoveném rozsahu kmitočtů, na prvky vnitřní struktury. Jedná se o destruktivní zkoušku. Obvykle je vhodná pro pouzdra s dutinou.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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