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Homepage>CSN Standards>94 OUTFITTING ARTICLES>9450 Testing of protecting layers>CSN EN ISO 8289-1 - Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects - Part 1: Swab test for nonprofiled surfaces
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Released: 01.09.2020
CSN EN ISO 8289-1 - Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects - Part 1: Swab test for nonprofiled surfaces

CSN EN ISO 8289-1

Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects - Part 1: Swab test for nonprofiled surfaces

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Number of Standard:CSN EN ISO 8289-1
Category:945054
Pages:16
Released:01.09.2020
Catalog number:510293
DESCRIPTION

CSN EN ISO 8289-1

CSN EN ISO 8289-1 This document specifies two low voltage tests for detecting and locating defects that extend to the basis metal in vitreous and porcelain enamel coatings. Method A (electrical) is applicable to the rapid detection and determination of the general location of defects. Method B (optical), based on colour effects, is applicable to the more precise detection of defects and their exact locations. Both methods are commonly applied to flat surfaces. For more intricate shapes, such as undulated and/or corrugated surfaces, ISO 8289-2 is applicable. NOTE 1 - Selection of the correct test method is critical to distinguish the areas of increased conductivity detected by method B from actual pores that extend to the basis metal, which can be detected by both methods. NOTE 2 -The low voltage test is a non-destructive method of detecting defects and, therefore, is completely different from the high voltage test specified in ISO 2746. The results of the high and low voltage tests are not comparable and will differ.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.