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Homepage>CSN Standards>01 GENERAL CLASS>0120 Nanotechnologies>CSN P CEN ISO/TS 24672 - Nanotechnologies - Guidance on the measurement of nanoparticle number concentration
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Released: 01.02.2025
CSN P CEN ISO/TS 24672 - Nanotechnologies - Guidance on the measurement of nanoparticle number concentration

CSN P CEN ISO/TS 24672

Nanotechnologies - Guidance on the measurement of nanoparticle number concentration

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Number of Standard:CSN P CEN ISO/TS 24672
Category:012005
Pages:64
Released:01.02.2025
Catalog number:520431
DESCRIPTION

CSN P CEN ISO/TS 24672

CSN P CEN ISO/TS 24672 This document provides an overview of the methods used to determine the nanoparticle number concentration in liquid dispersions and aerosols. The methods described are the ensemble measurement techniques of differential centrifugal sedimentation (DCS), multi-angle dynamic light scattering (MDLS), small-angle X-ray scattering (SAXS) and ultraviolet-visible spectroscopy (UV-vis) and the particle counting methods of particle tracking analysis (PTA), resistive pulse sensing (RPS), single particle inductively coupled plasma mass spectrometry (spICP-MS), condensation particle counter (CPC), and differential mobility analysing system (DMAS). This document provides information on the use of each technique, along with considerations on sample preparation, advantages and limitations.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.